►FPGA Boards Selection Guide

►FMC Modules Selection Guide

The HiTech Global PCIe Gen6 to 1.85mm Test Adapter Module is a high-performance signal breakout and validation platform designed for PCI Express® Gen6 development, characterization, and compliance testing. Engineered for ultra-high-speed applications, the module provides precision 1.85mm RF connector interfaces for direct access to PCIe Gen6 differential lanes, enabling accurate signal integrity analysis using high-bandwidth oscilloscopes, vector network analyzers (VNAs), bit-error-rate testers (BERTs), and other advanced RF measurement equipment.

Optimized for next-generation 64 GT/s PCIe Gen6 architectures utilizing PAM4 signaling, the adapter is designed to preserve channel fidelity while minimizing insertion loss and reflections across extremely high-frequency operating ranges. 1.85mm connectors are widely recognized for supporting mode-free operation up to 67 GHz, making them ideal for PCIe Gen6 and other multi-gigabit serial interfaces.

The module serves as an essential development and debug tool for FPGA, accelerator, AI, networking, storage, aerospace, and data center platforms requiring high-speed PCIe validation. By exposing PCIe lanes through precision RF interfaces, engineers can efficiently perform eye diagram analysis, channel characterization, jitter measurements, equalization tuning, and compliance verification during hardware bring-up and system optimization.

Key features include:

• -PCI Express® Gen6 signal breakout capability
• -Precision 1.85mm RF interfaces for high-frequency measurements
• -Support for ultra-high-speed PAM4 PCIe signaling environments
• -Optimized PCB layout for superior signal integrity performance
• -Ideal for oscilloscope, VNA, and BERT connectivity
• -Suitable for FPGA, AI accelerator, networking, storage, and HPC platforms
• -Compact and robust design for laboratory and development environments